Product Description
Traceable calibration of test and measurement equipment is a requirement of the ISO 9000 series of standards. Basic Metrology for ISO 9000 Certification provides essential information for the growing number of firms registered for ISO 9000.



Dr. G.M.S. de Silva who has a lifetime of experience in metrology and quality management fields condenses that knowledge in this valuable and practical workbook. The book provides a basic understanding of the principles of measurement and calibration of measuring instruments falling into thefollowing fields; Length,Angle, Mass, Pressure, Force, Temperature and AC/DC Electrical quantities. Basic concepts and definitions, ISO 9001 requirements and uncertainty determinations are also included.


Includes worked examples in the text and solutions to problems which can be compared to real life situations.



Includes basic metrology principles and data that will be useful to test and calibration personnel in their day to day work.

Contains features of the metrology management structure which an organisation needs to set up in order to satisfy ISO 9000 criteria. ... Read more

Customer Reviews (1)

Review of Basic Metrology for ISO 9000 registration
This is an excellent book for those who want to learn about basic principles of metrology and calibration.The book also gives a nice introduction to ISO 9001 requirements for calibration of test and measuring instruments. It describes in simple terms how to calibrate instruments belonging to a number of measurement fields. Calibration of temperature sensors,pressure gauges, force measuring machines,load cells, multimeters are well described.The book is well illustrated and a comprehensive list of references is given at the end of each chapter. ... Read more

Product Description
Many of the topics listed in the Certified Calibration Technician (CCT) Body of Knowledge are presented in this comprehensive book which serves as an excellent reference to prepare for the certification exam. This book provides an overview of metrology and calibration principles and practices geared towards intermediate and advanced users with a basic understanding of the subject matter. Examples and figures are used throughout the book to aid in practically applying the material along with a helpful list of acronyms and abbreviations, a glossary of terms, and a bibliography for easy reference. ... Read more

Customer Reviews (4)

Very Disappointing
I could not have been more disappointed in the quality of the writing and content of this book.

This book covered a huge body of knowledge, unfortunately it only skimmed the surface on almost all topics.The measurement uncertainty section is particularly weak.As stated in a previous review the author uses questions and quotes standards excessively which makes the book difficult to read.

The Metrology Handbook is definately not designed as reference material for someone working in the quality field.

Very poorly written and edited
I was repeatedly surprised at how poorly this book is written and edited.I'm not even sure where to start.The writing is terrible.Bucher's name is the credited author of the majority of the chapters.Bad idea Jay ... let the writers write.Large sections of his chapters are wholly quoted from other authors and industry standards.It's cumbersome and annoying.An author is supposed to strain the key points from standards and explain them in meaningful ways.I could have just bought the standards and read them myself.

His use of questions to introduce a topic is intensely distracting.He literally blows out 8 to 10 questions in a row without saying a thing.Whole paragraphs were only questions with no answers .... When sprinkled in, that technique is effective, but I assure you, its overuse will drive you up the wall in this book.

Maybe the really problem here is my concept of what THE Metrology Handbook should look like.Metrology is arguably the cornerstone discipline of quality and reliability engineering.And in recent decades, no one has stepped forward to edit and publish a handbook on the topic - and it certainly deserves one.So I will credit Bucher for his willingness.But to approach the topic with eighth-grade writing is shameful.

The Metrology Handbook should be an institution for the generations like Mark's Handbook for Mechanical Engineers or the Machinery Handbook.Teary-eyed grandfathers should hug their granddaughters on graduation day, and hand them their first Metrology Handbook.(I'm a little choked up just thinking about that.)The Metrology Handbook should be an honorable tome.This book is far from that.

And where was the publisher?The American Society for Quality checked out on this one.With `Quality' in your name publishing a topic like metrology ... this book should be nothing less than excellent.Only the best managing editors and contributing authors should have been selected.And it should have been peer-reviewed.ASQ has published excellent books for many years.They could publish a better book than this with one-hand tied behind their back.What happened???

P.S. I'd bet my left pinky toe that the first reviewer was paid to write those glowing comments.Way to hit the keywords big guy!

There is better information at internet for free
Yes! There is better information at internet for free about metrology.This book provides very general information and its mathematical level is for high school students, not metrologists.Do not waste your money.

An impressive and complete introduction
Knowledgeably compiled and skillfully edited by Jay L. Bucher (Manager of Metrology Services, Promega Corporation, and President, Bucherview Metrology Services), The Metrology Handbook is an impressive and complete introduction that begins with the history and philosophy of metrological calibration, then proceeds to extensive presentations on "Quality Systems"; "Metrology Concepts"; "Mathematics and Statistics: The Use in Measurement"; "Uncertainty in Measurement"; Measurement Parameters"; and "Managing A Metrology Department or Calibration Laboratory". A core and seminal addition to professional and academic library collections, The Metrology Handbook is enhanced with a listing of professional associations, an article on "ASQ and Certification"; a glossary of meterology and classification terminology; "Common Conver-sions", and an accompanying CD.
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Product Description
In modern industrial environments where responsibility for quality control is being placed upon individual workers, the understanding of dimensional metrology principles is becoming increasingly important. That's why the fifth edition of our best-selling Fundamentals of Dimensional Metrology book offers a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field today. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Information on particular devices and concepts, previously presented in separate chapters, has been combined to improve the logical flow of the material. New chapter-end review questions have also been added to eliminate the potential for ambiguity, allowing readers to gauge their understanding as they progress through the book. ... Read more

Customer Reviews (7)

An easy to understand, comprehensive text although dated
From a hobbyist's perspective this is a great text on precision measurement. Written in the sixties, it covers all of the now affordable tools and techniques that were once state of the art. For a student or professional however, as other reviewers mention, it does not address more contemporary tools and standards.

The author writes clearly and builds each chapter in a logical way from concept to well-illustrated actual tools.

If you want to have a working knowledge of verniers, micrometers, indicators, levels, surface plates, gauge blocks etc, this is the book for you.

Can someone please write a better book!
This book needs to be completely scrapped and rewritten from scratch by someone who reads their own definitions and illustrations.Example:The definition of "resolution" refers to hand width at one point, to band width at another point, and the drawings contradict both of these.

A plea:Would someone who has experience in the field please write a better book?

Excellent Resource
As an ASQ certified Mechanical Inspector and Quality Technician, I would like to say that; This text is a fine resource for any person working in the metrology field. It covers a wide range of topics and is well worth having. Written in a style that is both informatve AND interesting. I was well pleased with this book.

Excellent Resource
As an ASQ certified Mechanical Inspector and Quality Technician, I would like to say that; This text is a fine resource for any person working in the metrology field. It covers a wide range of topics and is well worth having. Written in a style that is both informatve AND interesting. I was well pleased with this book.

This book leaves something to be desired
I have been reading this book for a class. I must say that this book is not as detailed as I would like it to be. I am an engineer and my expectation was that when a statement is made details would be provided to backup the statements. And the figures in the book are not easy to understand quickly. There must be a better book out there. ... Read more

Product Description
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
* End-of-chapter problems. ... Read more

Customer Reviews (1)

Please.
Thank you ... Read more

Product Description
Most of the software measures currently proposed to the industry bring few real benefits to either software managers or developers. This book looks at the classical metrology concepts from science and engineering, using them as criteria to propose an approach to analyze the design of current software measures and then design new software measures (illustrated with the design of a software measure that has been adopted as an ISO measurement standard). The book includes several case studies analyzing strengths and weaknesses of some of the software measures most often quoted. It is meant for software quality specialists and process improvement analysts and managers. ... Read more

Customer Reviews (1)

COSMIC is still alive and well in the 21st century
This book is divided in to three primary parts. The first part describes the rigorous methods and theory necessary to develop a functional size measurement. The second part discusses the limitations of functional size measurements and measures, such as the IFPUG function points, and the Use Case Points. The third part provides an illuminating inside story into the nuts to bolts development of the COSMIC functional size measurement (FSM).

I'm what the writer refers to as a practitioner, and as a practitioner, or software cost estimator, I thoroughly enjoyed the content of this book. The ideas and concepts were logically presented, and the material on COSMIC very much supplements the available material on the public domain site [...]. This book has given me a new found respect for COSMIC.

The challenge that all software cost estimators face with using functional size measurement is the fact that the majority of entities in the world are at CMMi level 2 or lower. What this means is that the functional user requirements that are critical to the successful development of FSM are less than optimal, and thus presents a challenge to the practitioner in developing a valid and defensible cost estimate of a software intensive system. There needs to be a way of coming up with backfired COSMIC points, so that there can be an automated way of backfiring these points much the same way as has been done with the unadjusted IFPUG function points. The simplicity and mathematical compatibility of the way the metrology is designed into COSMIC should, along with the contents of this book would be perfect ingredients for a software designer to come up with a computer software algorithm that can automatically calculate COSMIC function points. In my opinion, the lightness of the Agile methods, and as a result the simplified yet compelling written use cases are capable of being translated into COSMIC function points better than the IFPUG unadjusted function points.

Unfortunately, IFPUG was the first established functional size measurement organization, and it is still very alive and well. IFPUG has a very strong heritage, and according to the results contained in the ISBSG database, IFPUG function points are the most abundant. In short, a plan that is not perfect that is executed to the completion of the project is still better than a perfect plan that is rarely, if ever executed. Is IFPUG the Qwerty keyboard, and COSMIC the more efficient, but less used Dvorak keyboard? The answer to this question will be provided in the fullness of time. Was this book worth the price paid? To me, it definitely was, and any interested reader who wants to gain a better more grounded insight into how the COSMIC FSM method was developed must procure this invaluable resource. ... Read more

Product Description

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals.

Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications.

With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Product Description
An ELBS/LPBB edition is available. ... Read more

Product Description
Written by the leading authority in the subject, Handbook of Surface Metrology covers every conceivable aspect of measuring and characterizing a surface. Focusing both on theory and practice, the book provides useful guidelines for the design of precision instruments and presents data on the functional importance of surfaces. It also clearly explains the essential theory relevant to surface metrology. The book defines most terms and parameters according to national and international standards. Many examples and illustrations are drawn from the esteemed author's large fund of groundbreaking research work. This unparalleled, all-encompassing "metrology bible" is beneficial for engineering postgraduate students and researchers involved in tribology, instrumentation, data processing, and metrology. ... Read more

Product Description
This volume can be justified by the following three facts, the need to provide, from time to time, a co-ordinated set of lectures which present the relevant progress in Metrology, the increasing intertwining between Fundamental Physics and the practice of Metrological Measurements, and, third, the flurry of new and unexpected discoveries in this field, with a correlated series of Nobel Prizes bestowed to individuals working in Fundamental Constants research and novel experimental methods. One of the most fascinating and exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements, as well as the determination of the values and interrelations between the Fundamental Constants. In some cases, such as the caesium fountains clocks or the optical frequency standards, the definition of the value of a quantity is, in the laboratory, in the region of 10-16 and experiments are under way to reach 10-18. Many of these results and the avenues leading to further advances are discussed in this volume, along a major step in metrology, expected in the near future, which could change the 'old' definition of the kilogram, still based on a mechanical artifact, toward a new definition resting on a fixed value of a fundamental constant.

IOS Press is an international science, technical and medical publisher of high-quality books for academics, scientists, and professionals in all fields.

Some of the areas we publish in:

-Biomedicine
-Oncology
-Artificial intelligence
-Databases and information systems
-Maritime engineering
-Nanotechnology
-Geoengineering
-All aspects of physics
-E-governance
-E-commerce
-The knowledge economy
-Urban studies
-Arms control
-Understanding and responding to terrorism
-Medical informatics
-Computer Sciences ... Read more

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This book offers a clear and unambiguous approach to Engineering Metrology from a practitioner's point of view. It looks at dimensional surface measurement and roundness, covering how, where and when surfaces are measured, together with the appropriate techniques for their measurement. The author explores techniques common to surface microscopy and how surface texture and roundness instrumentation calibration methods are selected and employed. Through a comprehensive treatment of the subject, colour images and easy-to understand line diagrams, the reader will gain an insight into the techniques utilised in establishing surface and roundness analysis, across a broad spectrum of popular production processes. ... Read more

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A much-needed source of reliable, up-to-date information. In two easily searchable volumes, the Wiley Handbook of Metrology provides a balanced overview of the fundamentals and specialized areas, as well as recent advances in this continuously evolving field.
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Conceived as a reference manual for practicing engineers, instrument designers, service technicians and engineering students. The related fields of physics, mechanics and mathematics are frequently incorporated to enhance the understanding of the subject matter. Historical anecdotes as far back as Hellenistic times to modern scientists help illustrate in an entertaining manner ideas ranging from impractical inventions in history to those that have changed our lives.

Product Description

Metrological concepts like traceability or measurement uncertainty form important parts of international treaties and normative documents. Their applications e.g. in chemical or food analysis or in environmental monitoring are entering our daily life. The development of those concepts has been driven by demand on a world-wide scale from trade, industry and the legal systems. In the future, no chemist, geochemist, chemical , civil or environmental engineer and no other specialist dealing with chemical measurement data, and no decision maker, neither in trade and industry, in public or medical services, in the political and diplomatic arenas or in academic research can afford not to become acquainted with metrology, its concepts and impact.

Product Description
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems.

Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text.

Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput. ... Read more

Product Description
The story of Columbus voyage in terms of measurementsavailable to him, as well as the knowledge of geography at thetime. Develops context for Columbus voyages in terms of geodeticknowledge and the level of cartographic development.Examines thegreat navigators geographic & geodetic views of the earth, thatwere ridiculed by many, but were shared by other geographers andcosmographers at the time; covers significant attempt through the 16thcentury to determine the size of the earth; 22 Tables and 85illustrations analyze the effects of various systems of linearmeasurements Many maps show the varying concepts of the size of theearth over 2000 years; 18 show changes realized between 1490-1595.This book helps correct the distorted characterizations of thisscientist, and shows Columbus to be a man of his times and aggressivein the promotion of ideas of those who supported his proposal to sailwestward from Europe to the Orient. Harcover with dustcover-individually shrinkwrapped ... Read more

Product Description
A complete reference on silicon semiconductor metrology. Contains nearly 1300 references, more than 300 equations, and nearly 500 drawings, photographs and micrographs. Explains run-to-run and real-time control, considers how to improve physical measurement methods to meet more exact requirements, and more. ... Read more

Customer Reviews (1)

The best book on semiconductor metrology.
This book is the best that you will find on Semiconductor Metrology. Every chapter is written by the leading expert in the field. This is a much better approach than most textbooks, where one individual attempts to write the whole book themselves. It is a must have reference for anyone going to school or working in the semiconductor field. Highly recommend it. ... Read more

Product Description
Based on The International Metrology Congress meeting, this reference examines the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies; details the?improvement of measurement procedures to guarantee the quality of products and processes; and discusses the?development of metrology linked to innovating technologies. The themes of the Congress (quality and reliability of measurement, measurement uncertainties, calibration, verification, accreditation, sensory metrology, regulations and legal metrology) are developed either in a general way or applied to a specific economic sector or to a specific scientific field. ... Read more