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         Metrology:     more books (100)
  1. Metrology, Inspection, and Process Control for Microlithography XIV: 28-February-2 March 2000 Santa Clara, California (Proceedings of Spie Volume 3998)
  2. Three-Dimensional Imaging, Optical Metrology, and Inspection V: Proceedings of Spie 19-20 September 1999 Boston, Massachusetts (Proceedings of Spie--the ... Society for Optical Engineering, V. 3835.)
  3. Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference Proceedings / Materials Physics and Applications) by David G. Seiler, 2007-09-26
  4. Proceedings Of The International Forum On Dimensional Tolerancing And Metrology ( PAPERS PRESENTED IN DEARBORN, MICHIGAN, JUNE 17-19, 1993 )
  5. Gravitational Measurements, Fundamental Metrology and Constants (NATO Science Series C: (closed))
  6. Fringe '97 (Optical Metrology) by Werner Jueptner, 1997
  7. Metrology-based Control for Micro-manufacturing (Proceedings of Spie) by Kenneth W., Jr. Tobin, Fred Lakhani, 2001-06-05
  8. The impact of Israel on Western philosophy (Archives for mosaical metrology and mosaistics) by Ed Metzler, 1993
  9. Metrology, Inspection, And Process Control For Microlithography XVIII (Proceedings of Spie)
  10. Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
  11. Catalog of federal metrology and calibration capabilities by Kathryn O. Leedy, 1980-01-01
  12. Laser Metrology and Machine Performance IV
  13. Microsystems Engineering: Metrology and Inspection III, 23-25 June 2003 Munich, Germany (Proceedings of Spie)
  14. Advances in Fabrication and Metrology for Optics and Large Optics (Spie Volume 966)

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